Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
Exhaustive testing to detect software errors constantly demands more time within development cycles. Software errors with catastrophic consequences have often pushed forward innovations in software ...
Agilent Technologies Inc. today introduced a fast and easy-to-use test coverage prediction tool: N1194A Agilent Test Coverage Consultant (ATCC). The ATCC software performs two significant tasks. First ...
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